Featured in Cracking the code – 03-2011

Not falling through the cracks

Optical wafer inspection: Metrology systems are available in the market for the tedious task of detecting errors in wafers before they get forwarded onwards in the manufacturing line.

By

pv magazine

28 Feb 2011

Within the scope of solar module manufacturing, the wafer segment accounts for about 60 percent of the total costs incurred. Given such a significantly large portion of the cost-pie, it is pertinent for these wafers to be substantially error-free. Having said that, the efficient handling of these ultra thin elements in the production process of …

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