Video: Dow showcases ENGAGE PV POE for encapsulant films at SNEC 2017

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Potential induced degradation (PID) is a key issue affecting the performance of PV modules in the field. While improvements in cell production and module glass can also improve a module’s PID resistance, choice of encapsulant film is also a major factor.

Dow has focused on addressing this, deploying a material for encapsulant films that exhibits high resistance to PID, as well as a range of other benefits. The material has a low water vapor transmission rate, which can protect against corrosion and other issues arising from moisture, and offers protection against module discoloration.

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Dow representatives spoke with pv magazine about the innovation in using polyolefin, rather than ethylene vinyl acetate (EVA) as a base material for encapsulant film makers, and the effect this has on module performance and ultimately on the lifetime LCOE of PV power generation.

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