Video: Dow showcases ENGAGE PV POE for encapsulant films at SNEC 2017

Potential induced degradation (PID) is a key issue affecting the performance of PV modules in the field. While improvements in cell production and module glass can also improve a module’s PID resistance, choice of encapsulant film is also a major factor.

Dow has focused on addressing this, deploying a material for encapsulant films that exhibits high resistance to PID, as well as a range of other benefits. The material has a low water vapor transmission rate, which can protect against corrosion and other issues arising from moisture, and offers protection against module discoloration.

Dow representatives spoke with pv magazine about the innovation in using polyolefin, rather than ethylene vinyl acetate (EVA) as a base material for encapsulant film makers, and the effect this has on module performance and ultimately on the lifetime LCOE of PV power generation.