Scientists led by the U.S. National Renewable Energy Laboratory (NREL) have developed a new stress testing protocol for PV modules, one designed to simultaneously expose modules to multiple stresses, as they likely would be in the field. Putting modules through this test, the researchers have already been able to reveal new information regarding backsheet degradation, and they promise new insights into other degradation mechanisms both known and unknown as well.
A new test design from the University of Central Florida has challenged modules with different cell technologies. The results show advantages for the heterojunction modules tested. Here we discuss the new method with its designer.
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