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Potential-induced degradation (PID)

Foil method for PID test misleading if only one side of bifacial module is stressed

Results from PID stress tests can be misleading when bifacial PV modules are PID-stressed from just one side using the foil method in IEC TS 62804, according to a new study by Belgian researchers. An unintended electric field arises between the non-stressed side of the cell and the grounded interior of the climate chamber, which may have the undesired effect of causing additional PID stress.

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