An expert system developed08. June 2011 | Intersolar Europe 2011 |
GP Solar will be showcasing its GP TEX-Q .Scan at the Intersolar Europe. The GP TEX-Q .Scan is an optical inspection system for controlling texture quality of mono- and multi crystalline silicon wafers.
With this system, GP Solar developed an expert system for wet chemical texturing of multi-silicon wafers. The texturing quality, classified on a scale ranging from 1 (untextured) to 5 (overetched), is now determined with complex analysis algorithms. For senior process engineers, this step has thus far only been assessable with a sample set.
The GP TEX-Q .Scan is a combination of experience concerning the optimization of wet chemical processes and the company’s product line >GP Solar Inspect< in a compact measuring tool for process control. The inspection system can be integrated above or below of the reel or belt transport. The on-the-fly measurement has a throughput of one wafer per second and enables the continuous monitoring of the texturing process. Initial customer deliveries are planned for fall this year.
Choose between a digital and print subscription from pv magazine publisher Solarpraxis AG’s online shop!
- 6238 views
- 6234 views
- 5476 views
- 3343 views
- 3325 views
Want to publish your press releases for free? Simply log in or register, enter the information you want to appear and we'll publish it for you!