Aurora Control Technologies of Vancouver, Canada today launched the DecimaTM CI in-line emitter dopant measurement system. Specifically designed for the crystalline silicon photovoltaic manufacturing industry, the Decima CI is the industrys first in-line, non-contact emitter dopant measurement system featuring whole-wafer mapping at full production throughput for 100 percent of manufactured cells.
The Decima CI is the first in a family of products to be launched by Aurora that provide for continuous cost-effective measurement of the critical-to-quality wafer parameters in todays high-volume photovoltaic cell manufacturing processes. With the industrys high-throughput, continuous production methods, tight real-time measurement and control of emitter fabrication variability is necessary to profitably meet market demand for PV cells that combine low cost and optimal power output commented Gordon Deans, CEO of Aurora. In the development of the Decima CI, we worked closely with leading cell manufacturers to ensure that it focuses squarely on the issues affecting profitability, thereby providing rapid payback when used in production.
The Decima CI is ideal for both new and existing production lines as it is easily retrofitted with no downtime, features full wafer mapping programmability, and is configurable from a single lane unit up to ten lanes for high-throughput production. The Decima CI will be presented at the 26th European Photovoltaic Solar Energy Conference and Exhibition at stand number B2U/B6 in Hamburg, Germany, and will be available in September. Delivery time is approximately three months, depending on the system configuration.
