Zeta Instruments, Inc., a leading provider of cost-effective, precision optical profilers for micron-scale surface analysis, together with Applied Materials, has published a paper presented at the 37th IEEE Photovoltaic Specialists Conference.
The publication identifies a novel technology that helps improve the effectiveness and manufacturing of solar cells for the growing solar semiconductor wafer sector.
The publication, entitled, ‘Texture Process Monitoring in Solar Cell Manufacturing Using Optical Metrology', analyzes how with the assistance of innovative new optical profiler monitoring technology, it is possible to control etchant compounds composition and their duration of exposure on silicon wafers to produce surface textures that optimize light absorption of solar cells. Through the use of these methods, it is possible to significantly improve the efficiency and manufacturing consistency of photo-voltaic cells.
Authored by metrology and materials experts at both Zeta and Applied Materials, the paper delves into various surface texturing techniques in search of those that produce minimal reflectivity a crucial attribute of solar cell effectiveness and a critical step in solar cell production. With the help of the Zeta-20 optical profiler from Zeta Instruments, researchers were able to quickly and cost-effectively gather far more detailed surface data than previously possible, leading to the ability to define optimal surfacing etching and texturing processes.
Publication co-author, Kapila Wijekoon of Applied Materials, stated, "We believe these findings and broad availability of a cost-effective, advanced metrology tool that provides precision measurements of this caliber will provide solar manufacturers with the means to increase the effectiveness and quality of their wafer design and thereby optimize manufacturing output for the rapidly growing solar sector."
Zeta will showcase the metrology technology enabling these findings at the annual Intersolar North America conference in San Francisco, CA, July 12 to 14, 2011. To download a copy of the technical paper, ‘Texture Process Monitoring in Solar Cell Manufacturing Using Optical Metrology', Click here http://www.zeta-inst.com/IEEE_TexturePaper.pdf
IEEE PUBLICATION TITLE (Journal, Magazine, Conference, Book): 37th IEEE Photovoltaic Specialist Conference ?Copyright IEEE, June 2011
