Tunnel oxide passivated contact (TOPCon) modules have achieved incredible market penetration in just a few years. As the industry tackles long-term degradation, scientists continue to identify new failure modes. Near the physical limits of silicon cell technology, even small defects can have major impacts. Researchers are now developing mitigation strategies,
as Lior Kahana reports.
From left: Dr. Muhammed Umair Khan, Prof. Bram Hoex and Dr. Chandany Sen work together at UNSW on solar-cell reliability
Image: UNSW
Stay informed
pv magazine is the leading trade media platform covering the global solar photovoltaics industry. Log in or purchase a digital or print version of this issue to read this article in full.
The cookie settings on this website are set to "allow cookies" to give you the best browsing experience possible. If you continue to use this website without changing your cookie settings or you click "Accept" below then you are consenting to this.
