Wafer metrology sorter system


Schmid’s analyzer software compiles the measurement data of the finished wafers in a 3D brick, which establishes the basic information for specific intervention in the upstream production steps. The visual display of the surface roughness distribution on a wafer, as well as the distribution on all the wafers in the entire brick, allows important conclusions to be drawn about the cutting parameters. Upon request, the machine can be inspected and tested.