Horizontal large area mapping


Designed for quality control of TCO films in PV manufacturing of thin film solar cells, it offers uniformity mapping of film thickness and spectrally resolved Haze H(?) on glass sheets of all standard glass sizes. It comprises the computer controlled conveyor transport system and the sensor platform for haze and film thickness.

The special design of the system allows measurements at every position of the glass sheet, especially at the edges. Glass sheets can be loaded and unloaded manually or by robot. The high measurement speed allows even the integration of the system into a manufacturing line.

Additional sensors for the measurement of sheet resistance, of optical constants and band gap (spectroscopic ellipsometer), of current voltage characteristics and quantum efficiency are available.

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