Aurora Solar Technologies Inc., a Canadian process measurement and semiconductor manufacturing firm, has announced that an upgrade of its Decima Gemini infrared measurement tool can now characterize heterojunction (HJT) cell technology.
The tool utilizes infrared to measure critical parameters displayed by HJT cells’ transparent, conductive oxide (TCO) layers, which are vital in boosting HJT cell technology’s efficiency.
TCOs allow electrical current to flow from the active portion of the HJT cell to the metal contacts. A typical HJT cell has layers of amorphous silicon applied to both sides of the crystalline silicon wafer, with TCO layers also applied to absorb the power generated by the amorphous silicon.
During production of HJT cells, it is vital for manufacturers to ensure the TCO layers are uniform, in order to deliver maximum yield.
Aurora’s measurement process can help HJT manufacturers gain a greater level of standardization during cell production, aiding line ramp-up, plant design and the final performance of the cell, the company says.
“Our Decima infrared measurement technology is very versatile in its potential applications, and this is an excellent example of that versatility,” stated Gordon Deans, Aurora’s Chief Operating Officer. “Not only was this validation achieved with our existing field-proven technology, but we also understand from discussions with potential customers that no other viable measurement alternative exists at present.”
As HJT production techniques become more sophisticated, widespread and affordable, market adoption rates of this cell technology are growing. Aurora Solar said that it is in the process of commercializing its Decima Gemini tool for HJT.
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